POLISHING DEPENDENCE OF AN OPTICAL FIBER CONNECTOR'S
DAMAGE LAYER


David C. Douglass, david.douglass@sagitta.com
Joyce Kilmer, joyce.kilmer@sagitta.com
Sagitta Inc., 7 Oser Avenue, Hauppauge, New York 11788

Abstract: We present a method for measuring the thickness (in mm) and index of refraction of the high index damage layer at the end of an optical connector by using a standard dual wavelength back reflection meter. Using this method, we have systematically studied the extent of the resulting damage layer from various final polish process steps by varying polishing film types, pressures, times, etc. Such information can enable connector manufacturers to achieve consistent "Hyper PC" return loss performance from non angled connectors as desired by some end users.
2005 Optical Society of America OCIS codes: (060.2340) Fiber optics components

Full paper to be presented at OFC 2005, Anaheim, CA.

OFC 2005
Exposition: March 6-11, 2005 in Anaheim, California

Title: Polishing Dependence of an Optical Fiber Connector's Damage Layer
(NTuF1) Polishing Dependence of an Optical Fiber Connector's Damage Layer
David C. Douglass, Joyce Kilmer; Sagitta, Inc., USA.
NFOEC, NTuF. Connectors

Presentation Number:NTuF1
Presentation Time Start: 3/8/2005 2:30:00 PM
Presentation Time End: 3/8/2005 2:52:00 PM
Author Block:
David C. Douglass, Joyce Kilmer; Sagitta, Inc., USA.


Title: Session Chair
(NWL) Session Chair Joyce Kilmer; Sagitta, Inc., USA.
NFOEC , NWL. Fiber and Cable

Presentation Number: NWL
Presentation Time Start: 3/9/2005 4:00:00 PM
Presentation Time End:3/9/2005 5:30:00 PM
Author Block:
Joyce Kilmer; Sagitta, Inc., USA.